Journal papers

PUBLICATIONS: REFEREED JOURNAL PAPERS (Under review, published or accepted, from most recent)

  1. Fan, S. –K. S.* and Chen, M. –S. “Enterprise Intelligentization from Process Transformation to Artificial Intelligence Transformation”, under review.
  2. Fan, S. –K. S.*, Tsai, D. –M. and Yeh, P. –C. “Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced FDC Data in Semiconductor Manufacturing”, accepted by IEEE Transactions on Semiconductor Manufacturing (SCI).
  3. Fan, S. –K. S.*, Tsai, D. –M. and Shih, Y. –F. “Self-Assured Semi-Supervised Learning for Wafer Defect Pattern Classification”, under 2nd revision by IEEE Transactions on Semiconductor Manufacturing (SCI).
  4. Fan, S. –K. S.*, Chang, X. –W., and Lin, Y. –Y. (2022/10) “Product-to-Product Virtual Metrology of Color Filter Processes in Panel Industry”, IEEE Transactions on Automation Science and Engineering, 19(4), 3496-3507. (SCI)
  5. Fan, S. –K. S.*, Cheng, C. –W., and Tsai, D. –M. (2022/10) “Fault Diagnosis of Wafer Acceptance Test and Chip Probing between Front-End-of-Line and Back-End-of-Line Processes”, IEEE Transactions on Automation Science and Engineering (SCI), 19(4), 3068-3082.  (SCI)
  6. Jen, C. –H., Fan, S. –K. S.*, and Lin, Y. –Y. (2022/09) “Data-Driven Virtual Metrology and Re-Training Systems for Color Filter Processes of TFT-LCD Manufacturing”, IEEE Transactions on Instrumentation and Measurement, 71, pp. 1-12, 2022, Art no. 1006912. (SCI)
  7. Fan, S. –K. S.*, Hsu, C. –Y., Tsai, D. –M., Chou, M. C., Jen, C. –H. and Tsou, J. –H. (2022/07). “Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing”, IEEE Transactions on Automation Science and Engineering, 19(3), 1530-1541.      (SCI)
  8. Fan, S. –K. S.*, Jen, C. –H., Tsai, D. –M., Hsu, C. –Y., He, F. and Juan, L. –T. (2022/05). “Data Visualization of Anomaly Detection in Semiconductor Processing Tools”, IEEE Transactions on Semiconductor Manufacturing, 35(2), 186-197. (SCI)
  9. Fan, S. –K. S.*, Jen, C. –H. and W. –K. Lin (2022/04). “Data-driven optimization of accessory combinations for final testing processes in semiconductor manufacturing”, Journal of Manufacturing Systems, 63, 275-287. (SCI)
  10. Liu, F. –L., Fan, S. –K. S., Ndi, E. and Tu, J. –F. (2021/10). “An Efficient No-Shutdown Pipe-Fixing Freezing Design for Water Management System in Hospitals during COVID-19: A Case Study”, Water, 13(19), 2725.  (SCI)
  11. Fan, S. –K. S.*, Jen, C. –H., Hsu, C. –Y., and Liao, Y. –L. (2021/10). “A New Double Exponentially Weighted Moving Average Run-to-Run Control Using a Disturbance-Accumulating Strategy for Mixed-Product Mode”, IEEE Transactions on Automation Science and Engineering, 18(4), 1846-1860. (SCI)
  12. Tsai, D. –M., Fan, S. –K. S., and Chou, Y. –H. (2021/06). “Auto-annotated deep segmentation for surface defect detection”, IEEE Transactions on Instrumentation & Measurement, 70, 1-10, 2021, Art no. 5011410. (SCI)
  13. Fan, S. –K. S., Hsu, C. Y.*, Tsai, D. M., He, F*, and Cheng, C. C. (2020/10). “Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing”, IEEE Transactions on Automation Science and Engineering, 17(4), 1925-1936.               (SCI) 
  14. Fan, S. –K. S., Hsu, C. Y.*, Jen, C. H., Chen, K. L., Juan, L. T. (2020/10). “Defective Wafer Detection Using a Denoising Autoencoder for Semiconductor Manufacturing Processes”, Advanced Engineering Informatics, 46: 101166, 1-12. (SCI).
  15. Park, Y. J., Fan, S. –K. S.*, and Hsu, C. Y. (2020/09). “A Review on Fault Detection and Process Diagnostics in Industrial Processes”, Processes, 8, 1123. (SCI)
  16. He, Fei*, Wang, Chaojun, and Fan, S. –K. S.* (2019/11). “Fault detection and root cause analysis of batch process via novel nonlinear dissimilarity and comparative Granger causality analysis”, Industrial and Engineering Chemistry Research, 58(47), 21842-21854.  (SCI)
  17. Fan, S. –K. S.*, Tsai, D. M., He, F., Huang, R. Y. and Jen, C. –H. (2019/11). “Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques”, IEEE Transactions on Semiconductor Manufacturing, 32(4), 544-552. (SCI)
  18. Fan, S. –K. S.* and Jen, C. H. (2019/04). “An Enhanced Partial Search to Particle Swarm Optimization for Unconstrained Optimization”, Mathematics, 7, 353. (SCI)
  19. Fan, S. –K. S.*, Jen, C. H., and Lee, J. X. (2019/01). “Profile Monitoring for Autocorrelated Reflow Processes with Small Samples”, Processes, 7(2), 104. (SCI) MOST 105-2221-E-027-071-MY3
  20. He, F.*, Wang, C., and Fan, S. –K. S.* (2018/12). “Nonlinear fault detection of batch processes based on functional kernel locality preserving projections”, Chemometrics and Intelligent Laboratory Systems, 183(15), 79-89.       (SCI)
  21. Fan, S. –K. S.*, Su, C. J., Nien, H. T., Tsai, P. F., and Cheng, C. Y. (2018/09). “Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection”, Soft Computing, 22(17), 5707-5718.          (SCI)
  22. L. C. Wang, Fan, S. –K. S., Ting, C. J., Kuo, T. C., Lin, C. C., and Hsu, C. Y. (2018/07). “The Review of Production System for Advanced Intelligent Manufacturing”, Journal of Management & Systems, 25(3), 381-412. (TSSCI)
  23. Fan, S. –K. S.* and Ting, C. J. (2018/07). “Preface: Special issue for the Asia Pacific Industrial Engineering and Management Systems (APIEMS) 2016 Conference”, Engineering Optimization, 50(7), 1097-1098.        (SCI)
  24. Fan, C., Fan, S. –K. S.*, Wang, C. S., and Tsai, W. P. (2018/01). “Modelling Computer Recycling in Taiwan Using System Dynamics”, Resources, Conservation & Recycling, 128, 167-175.    (SCI)
  25. Fan, S. –K. S.*, Jen, C. H., and Lee, T. Y. (2017/04). “Modeling and Monitoring Nonlinear Profile of Heat Treatment Process Data by Using A Hyperbolic Tangent Function Approach”, Quality Engineering, 29(2), 226-243. (SCI)
  26. Fan, S. –K. S.*, Tsai, D. M., and Chuang, W. C. (2017/04). “Automatic Vision-Based Grain Analysis of Multi-Crystalline Solar Wafers Using Hierarchical Region Growing”, Engineering Optimization, 49(4), 617-632. (SCI)
  27. Fan, S. –K. S., Kuan, W. H., Fan, C.*, and Chen, C. Y. (2016/12). “Rainfall threshold assessment corresponding to the maximum allowable turbidity for source water”, Water Environment Research, 88(12), 2285-2291. (SCI)
  28. Fan, S. –K. S.*, Lin, S. C., and Tsai, P. F. (2016/06). “Wafer Fault Detection and Key Step Identification for Semiconductor Manufacturing Using Principal Component Analysis, AdaBoost and Decision Tree”, Journal of Industrial and Production Engineering, 33(3), 151-168.        (EI, ESCI)
  29. Fan, S. –K. S.*, Chang, J. –M. and Chuang, Y. C. (2015/08). “A New Multi-objective Particle Swarm Optimizer by Using Empirical Movement and Diversified Search Strategies”, Engineering Optimization, 47(6), 750-770. [SCI]
  30. Jen, C. –H. and Fan, S. –K. S.* (2014/12). “Profile Monitoring of Reflow Process Using Approximations of Mixture Second-order Polynomials”, Journal of Chemometrics, 28(12), 815-833.       [SCI]
  31. Yang, T. –K., Fan, S. –K. S., Fan, C.*, and Hsu, N. –S. (2014/08). “Establishment of turbidity forecasting model and early-warning system for source water turbidity management using back-propagation artificial neural network algorithm and probability analysis”, Environmental Monitoring and Assessment, 186(8), 4925-4934.      [SCI]
  32. Fan, S. –K. S.*, Fan, C., and Huang, C. –F. (2014/05). “A Trust Region Based Approach to Optimize Triple Response System”, Engineering Optimization, 46(5), 606-627.         [SCI]
  33. Chiu, C. –Y.*, Fan, S. –K. S., Shih, P. –C., and Weng, Y. –H. (2014/03). “Applying HBMO-based SOM in Predicting the Taiwan Steel Price Fluctuation”, International Journal of Electronic Business Management, 12(1), 1-14.     [EI]
  34. Fan, S. –K. S.*, Huang, H. –K. and Chang, Y. –J. (2013/11). “Robust Multivariate Control Chart for Outlier Detection Using Hierarchical Cluster Tree in SW2”, Quality & Reliability Engineering International, 29(7), 971-985. [SCI]
  35. Fan, S. –K. S.* and Chang, Y. –J. (2013/08). “An Integrated Advanced Process Control Framework Using Run-to-Run Control, Virtual Metrology and Fault Detection”, Journal of Process Control, 23(7), 933-942.   [SCI]
  36. Fan, S. –K. S.*, Chang, Y. –J. and Aidara, N. (2013/07). “Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine Functions”, Quality & Reliability Engineering International, 29(5), 743-758.         [SCI]
  37. Wang, Chen-Shu, Wu, Tsan-Hung, and Fan, S. –K. S.* (2013/05). “An Enhanced Case-Based Diagnosis Mechanism for Abnormal Production Administration”, International Journal of Production Research, 51(10), 3131-3142. [SCI]
  38. Fan, S. –K. S., Fan, C.*, Yang J. –H. and Liu, F. –R. (2013/01). “Disassembly and Recycling Cost Analysis of Waste Notebook and the Efficiency Improvement by Re-design Process”, Journal of Cleaner Production, 39, 209-219.               [SCI]
  39. Koksoy, O.* and Fan, S. –K. S. (2012/08). “An Upside-down Normal Loss Function-based Method to Quality Improvement”, Engineering Optimization, 44(8), 935-945.  [SCI]
  40. Fan, S. –K. S.* and Chuang, Y. –C. (2012/07). “A New Entropy-based Image Registration Method Using Image Intensity Difference”, Machine Vision and Applications, 23(4), 791-804.              [SCI]
  41. Fan, S. –K. S.* and Chang, Y. –J. (2012/06). “Advanced Process Control Using Partial Least Squares”, Advanced Materials Research, 542-543, 124-127. [EI]
  42. Fan, S. –K. S.*, Lo, L. –C., Chang, Y. –J., Lin, C. –J, and Tsung, F. (2012/04). “Prediction of Time-Varying Metrology Delay for dEWMA and RLS-LT Controllers”, Journal of Process Control, 22(4), 823-828. [SCI] NSC 97-2221-E-155-045-MY3
  43. Fan, S. –K. S.*, Yao, N. –C., Chang, Y. –J., and Jen, C. –H. (2011/09). “Statistical Monitoring of Nonlinear Profiles by Using Piecewise Linear Approximation”, Journal of Process Control, 21(8), 1217-1229.  [SCI]
  44. Fan, S. –K. S.* and Huang, K. –N. (2011/06) “A New Search Procedure of Steepest Ascent in Response Surface Exploration”, Journal of Statistical Computation & Simulation, 81(6), 661-678.      [SCI]
  45. Fan, S. –K. S.*, Chuang, Y. –C., and Wu, J. –R. (2011/05). “A New Cross-Correlation Based Image Registration Method”, Applied Mechanics and Materials, 58-60, 1979-1984.  [EI]
  46. Chuang, Y. –C. and Fan, S. –K. S.* (2011/05). “An Image Registration Method Based upon Information Theorem on Overlapped Region”, Applied Mechanics and Materials, 58-60, 1985-1989.       [EI]
  47. Fan, S. –K. S.* and Chuang, Y. –C. (2010/11) “Automatic Detection of Region-Mura Defects in TFT-LCD Based on Regression Diagnostics”, Pattern Recognition Letters, 31(15), 2397-2404. [SCI]
  48. Fan, S. –K. S.* and Chang, Y. –J. (2010/09) “Recursive Least Squares Run-to-Run Control with Metrology Delays”, Industrial Engineering & Management Systems, 9(3), 262-274. 
  49. Fan, S. –K. S.* and Chang, Y. –J. (2010/07). “Multiple-Input Multiple-Output Double Exponentially Weighted Moving Average Controller Using Partial Least Squares”, Journal of Process Control, 20(6), 734-742.  [SCI]
  50. Fan, S. –K. S.* and Chang, J. –M. (2010/05) “Dynamic Multi-Swarm Particle Swarm Optimizer Using Parallel PC Cluster Systems for Global Optimization of Large-scale Multimodal Functions”, Engineering Optimization, 42(5), 431-451. [SCI]
  51. Fan, S. –K. S.*, Huang, C. –F. and Chang, K. –W. (2010/03) “Optimization of Triple Response Systems: Using the Dual Response Approach and the Hooke-Jeeves Search Method”, Industrial Engineering and Management Systems, 9(1), 10-19.
  52. Fan, S. –K. S.*, Lin, Y., Fan, C. –M. and Wang, Y. –Y. (2009/11) “Process Identification Using A New Component Analysis Model and Particle Swarm Optimization”, Chemometrics and Intelligent Laboratory Systems, 99(1), 19-29.       [SCI]
  53. Chuang, Y. –C. and Fan, S. –K. S. (2009/09) “Automatic TFT-LCD Mura Inspection Based on Studentized Residuals in Regression Analysis”, Industrial Engineering and Management Systems, 8(3), 148-154.  
  54. Fan, S. –K. S.* and Chang, K. –W. (2009/07) “Construct D-Optimal Designs Using Modified Particle Swarm Optimization”, Journal of Advanced Engineering, 4(3), 259-266.
  55. Fan, S. –K. S.* and Chang, J. –M. (2009/07) “A Parallel Particle Swarm Optimization Algorithm for Multi-objective Optimization Problems”, Engineering Optimization, 41(7), 673-697.                [SCI]
  56. Fan, S. –K. S* and Lin, Y. (2009/07). “A Fast Estimation Method for the Generalized Gaussian Mixture Distribution on Complex Images”, Computer Vision and Image Understanding, 113(7), 839-853.  [SCI]
  57. Jiang, B. C., Wang, C. C., Lu, J., Jen, C. H., and Fan, S. –K. S. (2009/06). “Using Simulation Techniques to Determine Optimal Operational Region for Multi-Responses Problems,” International Journal of Production Research, 47(12), 3219-3230.     [SCI]
  58. Fan, S. –K. S.*, Lin, Y. and Wu, C. –C. (2008/12). “Image Thresholding Using a Novel Estimation Method in Mixture Generalized Gaussian Distribution Modeling”, Neurocomputing, 72, 500-512.       [SCI]
  59. Fan, S. –K. S.* and Wang, C. Y. (2008/07). “On-line Tuning System of Multivariate dEWMA Control Based on a Neural Network Approach,” International Journal of Production Research, 46(13), 3459-3484.               [SCI]
  60. Fan, S. –K. S.* and Zahara, E. (2007/09). “A Hybrid Simplex Search and Particle Swarm Optimization for Unconstrained Optimization,” European Journal of Operational Research, 181, 527-548.            [SCI]
  61. Fan, S. –K. S.*, Fan, C., Kung, P. and Wang, C. Y. (2007/07). “Development of Run-to-Run (R2R) Controller for the Multiple-Input Multiple-Output (MIMO) System Using Fuzzy Control Theories,” International Journal of Production Research, 45(14), 3215-3243. [SCI]
  62. Fan, S. –K. S.* and Lin. Y. (2007/07). “Multiple-input Dual-output Adjustment Scheme for Semiconductor Manufacturing Processes Using Dynamic Dual Response Approach,” European Journal of Operational Research, 180, 868-884.                [SCI]
  63. Fan, S. –K. S.* and Lin, Y. (2007/04). “A multi-level thresholding approach using a hybrid optimal estimation algorithm,” Pattern Recognition Letters, 28, 662-669.             [SCI]  
  64. Fan, S. –K. S., and Huang, K. N. (2007/03). “AMSE Optimal Design Using Generalized Estimation for Multi-factor Response Surfaces,” Journal of Chemometrics, 21, 126-132.                [SCI]      
  65. Fan, S. –K. S.* and Chiu, Y. –Y. (2007/03). “A Decreasing Inertia Weight Particle Swarm Optimizer,” Engineering Optimization, 39(2), 203-228. [SCI]
  66. Fan, S. –K. S.*, Liang, Y. C. and Zahara, E. (2006/08). “A Genetic Algorithm and a Particle Swarm Optimizer hybridized with Nelder-Mead Simplex Search,” Computers & Industrial Engineering, 50(4), 401-425.  [SCI]
  67. Fan, S. –K. S.* and Kao, C. K. (2006/04). “Development of confidence interval on Taguchi capability index Using a Bayesian approach,” International Journal of Operations Research, 3(1), 56-75.
  68. Fan, S. –K. S.* and Zahara, E. (2006/01). “Stochastic Response Surface Optimization via an Enhanced Nelder-Mead Simplex Search Procedure,” Engineering Optimization, 38(1), 15-36.        [SCI]
  69. Fan, S. –K. S.* (2005/11) “A Multiple-Input Single-Output (MISO) Ridge Optimizing Quality Controller for Semiconductor Manufacturing Processes,” International Journal of Production Research, 43(22), 4745-4770.              [SCI]
  70. Fan, S. –K. S.* and Lin, Y. (2005/06). “An Evaluation of Multiple-input Dual-output Run-to-Run Control Scheme for Semiconductor Manufacturing,” Industrial Engineering and Management Systems, 4(1), 54-67.
  71. Zahara, E. Fan, S. –K. S.* and Tsai, D. M. (2005/06). “Optimal Multi-Thresholding using A Hybrid Optimization Approach,” Pattern Recognition Letters, 26, 1082-1095.     [SCI]       NSC93-2213-E-155-009
  72. Zahara, E. and Fan, S. –K. S.* (2005/02). “Real-Coded Genetic Algorithm for Stochastic Optimization: A Tool for Recipe Qualification of Semiconductor Manufacturing under Noisy Environments,” International Journal of Advanced Manufacturing Technology, 25, 361-369. [SCI] NSC91-2213-E-155-059
  73. Huang, K. N., Fan, S. –K. S.* (2004/10). “A Note on Minimum Bias Estimation in Response Surfaces,” Statistics & Probability Letters, 70, 71-85. [SCI]  NSC92-2213-E-155-013
  74. Jen, C. H., Jiang, B. C., and Fan, S. –K. S.* (2004/10). “A general run-to-run (R2R) control framework using self-tuning control for multiple-input multiple-output (MIMO) processes,” International Journal of Production Research, 42(20), 4249-4270.   [SCI]
  75. Fan, S. –K. S.* and Kao, C. K. (2004/9). “Lower Bayesian Confidence Limits on the Process Capability Index Cpm: A Comparative Study,” Journal of the Chinese Institute of Industrial Engineers (in English), 21(5), 444-452. [EI]
  76. Fan, S. –K. S.*, Liang, Y. C. and Zahara, E. (2004/8). “A Hybrid Simplex Search and Particle Swarm Optimization for the Global Optimization of Multimodal Functions,” Engineering Optimization, 36(4), pp. 401-418. [SCI]
  77. Fan, S. –K. S.* (2003/12). “A different view of ridge analysis from numerical optimization,” Engineering Optimization, 35(6), pp. 627-647. [SCI]
  78. Fan, S. –K. S.* (2003/9). “Implementation of Ridge Analysis on Quadratic Response Surfaces,” Journal of Statistical Computation and Simulation, 73(9), pp. 675-684. [SCI]
  79. Fan, S. –K. S.*, Jiang, B. C., Jen, C. H. and Wang, C. C. (2002/9) “SISO Run-to-Run Feedback Controller using Triple EWMA Smoothing for Semiconductor Manufacturing Processes,” International Journal of Production Research, 40(13), pp. 3093-3120. [SCI]
  80. Chen, M. J., and Fan, S. –K. S.* (2002/9). “Tolerance Evaluation of Minimum Zone Straightness Using Nonlinear Programming Techniques: A Spreadsheet Approach,” Computers & Industrial Engineering, 43, pp. 437-453.              [SCI]
  81. Fan, S. –K. S.* (2001/6). “A Householder Tridiagonalization Strategy for solving a constrained quadratic minimization problem,” Engineering Optimization, 33(3), pp. 261-277.   [SCI]
  82. Fan, S. –K. S.* (2001/2). “Understanding the method of canonical analysis in response surface methodology,” Journal of Propagations in Probability and Statistics, 1(2), pp. 201-208.
  83. Wu, S. H., and Fan, S. –K. S.* (2000/12). “Process Capability Analysis for both Normal and Non-normal Data,” Journal of Quality, 7(2), pp. 93-115.  [EI]
  84. Fan, S. –K. S.* (2000/10). “A Generalized Global Optimization Algorithm for Dual Response Systems,” Journal of Quality Technology, 32(4), pp. 444-456.   [SCI]
  85. Fan, S. –K. S.* (2000/9). “Quality Improvement of Chemical-Mechanical Wafer Planarization Process in Semiconductor Manufacturing Using a Combined Generalized Linear Modeling-Nonlinear Programming Approach,” International Journal of Production Research, 38(13), pp. 3011-3029. [SCI] NSC89-2213-E-131-009
  86. Fan, S. –K. S.* (1999/8). “Computational Schema on Ridge Analysis,” Communications in Statistics: Simulation and Computation, 28(3), pp. 767-783. [SCI]   NSC88-2213-E-131-004
  87. Fan, S. –K. S.* and Del Castillo, E. (1999/8). “Calculation of an optimal region of operation for dual response systems fitted from experimental data,” Journal of the Operational Research Society, 50(8), pp. 826-836.    [SCI]
  88. Del Castillo, E., Fan, S. –K. S., and Semple, J. (1999/1). “Optimization of Dual Response Systems: A Comprehensive Procedure for Degenerate and Nondegenerate Problems,” European Journal of Operational Research, 112(1), pp. 174-186 [the authors’ names are in alphabetical order].       [SCI]
  89. Del Castillo, E., Fan, S. –K. S., and Semple, J. (1997/7). “Computation of Global Optima in Dual Response Systems,” Journal of Quality Technology, 29(3), pp. 347-353 [the authors' names are in alphabetical order].              [SCI]
  90. Fan, S. –K. S.* (1997/5). “Repairing Degeneracy in the Ridge Analysis and Dual Response Problems,” Mingchi Institute of Technology Journal, 29, pp. 147-153.

REFEREED PAPERS IN EDITED CONFERENCE VOLUMES

  1. Fan, S. –K. S.* and Chang, J. –M. (2007/07). “A Modified Particle Swarm Optimizer Using an Adaptive Dynamic Weight Scheme”, Human-Computer Interface (HCI) International Conference-2007, Beijing, China, accepted for publication in the proceedings volumes of Lecture Notes in Computer Science (LNCS), 4561, pp. 56-65, Paper ID: 2224.            [SCI]

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